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Home > PXI Semiconductor Test System

GeoTest TS-900 PXI Semiconductor Test System

Geotest TS-900 PXI semiconductor test system
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Geotest TS-900 configurable benchtop PXI based semiconductor test system with RTI Pogo pin receiver test head interface. Shown here with portable test chassis.
RTI customized load board test interface for Geotest TS-900 PXI system
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Blown up view of the frame, costomizable Pogo pin interconnect test head, and self-test load board.
Bottom view of RTI customized TS-900 test head interface
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Bottom view of the test head interface. Test head can incorporate a variety of connectors including RF and coaxial via SMA block.
> View the complete product description at GeoTest's website
> Download complete TS-900 PXI semiconductor test system data sheet

Robson Technologies, Inc. is now the Northern California sales representative for the GeoTest TS-900 PXI Semiconductor Test System. RTI is directly responsible for the design and manufacturing of the load board and test interface used on this highly configurable test system.

Overview

The TS-900 PXI Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top or as an integrated cart configuration, the TS-900 takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications. The test system incorporates a custom-designed, performance test interface that supports the use of PCB DUT (Device Under Test) boards — a proven and high-performance method for interfacing to the device under test. Additionally, the receiver interface’s pin blocks are field configurable, allowing users to upgrade the receiver when they modify or upgrade the system for new applications. The configuration of the receiver can support up to 512 dynamic digital channels, as well as a range of analog, power supply and RF resources.

Receiver Interface

Robson Technologies Inc. worked closely with GeoTest to create a versatile load board interface. The TS-900 employs a modular, pogo-pin style receiver interface which consists of various pin blocks and is field re-configurable. Interfacing to the device under test (DUT) is done via a device specific PCB which mates to the pogo pin interface and is held in position with an integral stiffener / hold-down assembly. For digital interfacing, the receiver employs dual, 68-pin block assemblies which connect directly to the TS-900’s PXI digital instrument resources, providing a high performance, controlled impedance interface. For user power connections, a power block is available which supports up to (4) user power suppliers and for general purpose analog and switching applications, a 78 pin block assembly with mating D-sub connector is available. RF and coaxial connections can be accommodated via an 8 connector, SMA block. All receiver block positions are interchangeable, offering a high degree of flexibility.

Software

The TS-900 is supplied with ATEasy, Geotest’s test development and test executive software suite; DIOEasy – a comprehensive digital test tool set for developing, debugging and importing digital test vectors; and all necessary instrument drivers which are compatible with variety of application development environments including ATEasy, LabWindows, LabVIEW, Microsoft and Borland C/ C++, Microsoft Visual BASIC, and Borland Delphi.

Additional Information Regarding Test System Features


GeoTest TS-900
Geotest - Marvin Test Systems, Inc.
1770 Kettering
Irvine, CA 92614
P: 1-949-263-2222

Additional Information Regarding interfacing capabilities:


RTI - More Info about Test System Interfacing
Robson Technologies, Inc.
135 East Main Ave. Suite 130
Morgan Hill, CA 95037
P: 1-408-779-8008
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