Complete Production Test Change Kits for Auto Handlers
RTI provides complete design and manufacturing services for custom change kits, including the sockets, soak trays, dump trays, shuttle interfaces, DUT boards, and tester interfaces for auto handlers. We have designed unique interfaces including using a common universal DUT board and tester interface for a family of optical devices. RTI developed a unique solution for testing a family of optical devices consisting of both QFP and QFN package types. The test system and handler required the devices to be tested dead bug (package pads facing up). A universal mother board (tester interface) was designed by RTI that permitted each device in the family to use only four unique assemblies. (Work Press Assembly, Socket Base Assembly, Soak Boat, and Dump Tray). This substantially reduced costs of the change kits and reduced the change over time between the device types.
This work press assembly incorporates a device specific daughter card, socket tops, and the DUT vacuum pick up assemblies. The work press assembly interfaces to universal mother board using RTI pogo pin blocks shown below.
This Pogo Block assembly mounts in the handler base and provides a universal interface between the Work Press Assembly and the mother board (DUT board). The device specific socket base mounts in the center of this assembly. The pogo pin blocks and individual pogo pins are designed to be easily replaced. The universal mother board mounts to the bottom side of this assembly.
The universal mother board (bottom view shown) provides the interface between the device specific daughter cards and the test system. This assembly is universal for the entire family of devices and provides a considerable cost savings over a dedicated DUT board for each package type.
The device specific socket base assembly contains eight (four shown) individual spring loaded floating pieces which provide final alignment of the DUT to the lens mounted on the floating pieces. Critical tolerances in this assembly were held to +/- 50 micron.