Download full PDF data sheet with photographs here.
The 750 Series Module Test Fixture (MTF) is a standard platform combining ease of use, operator efficiency and repeatability in engineering, production, and characterization environments for the testing of electronic sub-assemblies. Each test fixture is customized for the Unit Under Test (UUT) using the Personalized Test Module. The Personalized Test Module includes a Pin Electronics Interconnect PCB which you can design or RTI can provide. RTI will work with your engineering team to insure the optimum interface for your products.
The key feature of this test fixture is the lid motion. The fully open position allows easy access to the test surface for insertion and removal of the UUT. As the lid is closed the last 0.3 inches of travel is vertical, insuring exact alignment and even pressure on the UUT, preventing lifting of the UUT and damage to the pogo pins. Linear bearings provide smooth and accurate operation.
RTI will design the Personalized Test Module to meet your test specifications. This includes the pogo pin block, the UUT alignment block, and the Pin Electronics Interconnect PCB. Detailed specifications are available to allow the customer to design the Pin Electronics Interconnect Module. The versatility of the 750-MTF may allow for multiple UUTs to be tested at one time.
Specifications
- Fixture size: 5.5 x 7.0 x 4.0 inches
- Maximum UUT size: 3.75 x 2.5 inches
- Vertical travel: 0.3 inches minimum
- Frame material: Anodized aluminum
- Pogo pins: See separate specifications
- Personalized test module: Ultem
Features
- Linear bearings for smooth vertical travel
- Easy access to UUT
- PCB based interconnect - no discrete wiring
- Test pins are easy to replace
Other available options
- Fine pitch test probes (0.5mm pitch)
- Coaxial probes for RF
- Multiple UUT capability
- Open top lid for FA probing
- Double-sided test points
- "Floating" alignment block
How It Works
With the lid open
The operator has full access to test area making it easy to place and remove the Units Under Test (UUT).
With the lid partially closed
The lid swings through an arc, and then the linear bearings provide 0.3 inches of vertical compression of the device under test onto the test pins. The vertical motion prevents damage to the DUT and assures that the test pins compress equally with no shear.
With the lid closed
The device under test, pogo pin test block, and driver board all fit securely with clean connections.