Overview

MultiTrace is RTI’s benchtop curve tracer system for electrical characterization, failure analysis, and counterfeit device detection. It provides non-destructive electrical test on integrated circuits, bare die, and board-level assemblies. Designed for lab environments that require flexibility and repeatable results, MultiTrace supports a wide range of package types and pin configurations while maintaining stable electrical performance across each test condition.

About MultiTrace

MultiTrace sources and measures current and voltage to capture signatures and identify device behavior under bias. It supports automated sweeps and comparison testing for analyzing opens, shorts, leakage, and functional response. MultiTrace systems connect directly to RTI sockets, DUT boards, and adapter fixtures, offering dependable contact integrity and easy reconfiguration between test setups.

Each system is shipped complete with a controller, LCD monitor, and DataTrace Basic software package for test setup, curve display, and data management. Optional software upgrades expand automation, analysis, and reporting capability for larger lab workflows.

Key Capabilities

• Perform powered and unpowered curve tracing across multiple device types
• Execute automated voltage and current sweeps with programmable parameters
• Compare device response to known-good references for anomaly detection
• Detect opens, shorts, and leakage through graphical I-V results
• Support latch-up, ESD, and reliability testing
• Interface with optical fault-localization tools and external analysis equipment
• Save, overlay, and export data for documentation and correlation
• Fully compatible with RTI sockets, DUT boards, and adapter fixtures

Hardware of MultiTrace

MultiTrace features a benchtop design, starting with a core system that includes a test chassis (pictured above) with a switch card and power supply. This foundational setup can be customized and expanded into various configurations to accommodate higher pin counts and enhance functionality.

Common Features:

• Benchtop Form fits on half of a typical lab bench
• 216, 324, 432 and 625 pin configurations are popular (other sizes available)
• Supports 2, 4, and 6 bus standard configurations
• 2 bus, 1080 pin with Octopogo interface available for Desktop MultiTrace
• Fixtures include access to all drives and measurement nodes by way of Banana Jacks
• Most Configurations are Upgradable
• Remote cable available for interface with microscope for Fault Localization Methods

Test Applications Supported

Failure Analysis: MultiTrace allows for detailed characterization of devices that have failed in production or in the field, identifying anomalies and clues that can lead to the root causes of failure in an effort to prevent future occurrences and improve product design.

Reliability Testing: With MultiTrace, devices undergo rigorous testing under various environmental and operational conditions can be monitored for damage to the electrical connection to the pins in order to ensure their long-term reliability and performance.

Counterfeit Device Analysis: MultiTrace is useful for verifying the authenticity of electronic components, protecting the supply chain from counterfeit parts that can compromise system integrity. Signatures of devices can be saved and compared among like devices to show similar internal construction.

Nondestructive Electrical Test: This application utilizes MultiTrace to perform electrical testing on suspected counterfeit devices without causing any physical damage, ensuring their functionality and compliance with specifications after testing is done.

Opens, Shorts, and Leakage Testing (OSL): MegaTrace provides precise measurements for detecting open circuits, short circuits, and leakage currents in electronic devices, crucial for quality control and troubleshooting. Evaluate linearity of leakage and shorts just by looking.

Post-Decap Electrical Inspection: After decapsulation of an integrated circuit, MultiTrace curve trace results can be compared to before decapsulation to show it has not changed as a result of the procedure.

Optical Fault Localization: Using advanced optical techniques, MultiTrace helps provide the necessary electrical bias to the leakage to aid in pinpointing the exact location of faults within a device, enabling efficient and accurate repairs.

ESD Testing: When Electrostatic Discharge (ESD) testing is done using other tester hardware, MultiTrace test results help find the damage that may have occured and helps ensure that devices can withstand electrostatic events, which are common in real-world environments, thereby preventing premature failures.

Latch-Up Testing: MultiTrace is one of the very few automated tools that conducts latch-up testing to assess the susceptibility of CMOS circuits to latch-up conditions, which can lead to catastrophic device failure if not properly managed.

Supply Current Measurements: By measuring the supply current accurately, MultiTrace helps in identifying excessive power consumption issues and ensuring that devices meet their power efficiency targets. High Static Supply Current (IDDQ) is a common failure signature that Multitrace can measure using repeatable, easy-to-configure test conditions.