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Sample size or 100% test, which is better for counterfeit screening?
Curve tracing is being adopted as a tool for electrically screening devices for evidence of counterfeiting as the need to detect fake or compromised IC chips continues. The process of [...]
Cartridge Carriers and Sockets 2021 Brochure
Introduction to RTI's Cartridge Carriers and Sockets We recommend viewing this document in full-screen mode by clicking the "Fullscreen" icon on the bottom left of the toolbar. Contac [...]
How to use curve tracing for Optical Fault Localization (including Lock-in Thermography)
Optical fault localization methods rely on the combination of a microscope with an imaging system and an electrical connection to send current through damaged circuits in a semiconduc [...]
How to use MTFixture to setup files for universal sockets and adapter boards
RTI’s MultiTrace system is widely recognized as the most efficient way to curve trace large IC devices. The software easily configures for a wide range of test conditions over a wide r [...]
Curve trace methods to screen counterfeit IC devices
While a complete screening program includes a range of Optical, X-Ray, CSAM, chemical resistance and other physical inspections, this post will focus specifically on electrical test an [...]
Are you overlooking Latch-Up?
Back in the 1980s and 1990s, latch-up was a huge concern for the semiconductor world. The original test procedure for latch-up “JEDEC-17 Latch-Up in CMOS Circuits” was published in 19 [...]
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