Cartridge Carrier Test Socketsmarketing2023-09-27T08:36:50-07:00
CARTRIDGE CARRIER & SOCKET SOLUTIONS
Reduce device handling errors by testing batches of devices using a cartridge carrier that travels with the DUTs between tests.
CARTRIDGE CARRIER AND SOCKET DESIGN
Cartridge Carriers are a two-piece design that consists of a drilled multi-site tray and a retaining lid. Each cartridge is loaded once with multiple DUTs and used with a corresponding test socket in every stage of the product’s test lifecycle. Compatible cartridge-specific test sockets include their own design options that make them suitable for each unique test configuration.
Devices are loaded into a multi-site tray and secured with a screw down lid. Holes are drilled at each test site to correspond to the pinout of each DUT – no electrical contacts are included.
Multi-Site Test Sockets
Each test site is loaded with pogo pins that match the DUT footprint, contacting each DUT through the drilled holes on the bottom of the cartridge carrier when screwed down onto the socket.
Single Site Clamshell Sockets
Each DUT in the cartridge can be individually tested. Alignment posts positioned close to the pogo pins in the socket body match alignment holes at each test site on the cartridge.
Multi-Site Clamshell Sockets
Combining the Multi-Site Test Socket and Single Site Clamshell Socket designs results in the Multi-Site Clamshell Socket. Alignment posts positioned on the outside of the socket body match alignment holes at the perimeter of the cartridge
Cartridge Carrier Test Sockets Designed to Your Needs
As modern CSP devices continue to shrink in size, the difficulty in handling these devices between tests becomes a greater challenge. Constantly loading and unloading test sockets with such unwieldy small devices increases the risk of inventory loss due to product mishandling. RTI developed this Cartridge Carrier and socketing solution for device manufacturers that need to test volumes of very small WLCSP, MEMs Sensors, and packaged IC devices across a variety of test platforms.
Device-specific cartridge carriers are designed to protect small and fragile DUTs both during tests and in between test sequences. Cartridge carriers themselves do not include any pogo pins or electrical contacts and must be used with compatible test sockets to complete the interface between the DUT and PCB. Cartridges are typically 80mm x 20mm x 3.3mm assembled. Custom cartridge footprints and device arrays are available.
The carrier base (maroon) is precision machined with a series of pockets, each drilled to match the footprint and dimensions of the DUTs. A shallow groove is milled across each pocket to provide additional airflow across each DUT during the test. Devices are loaded into each pocket with balls/pads/leads aligned to the drilled holes that will later be probed by pogo pins in the test socket. Cartridges can accept devices with 0.3mm pitch and greater.
The cartridge lid (blue) fully retains the devices in the cartridge, preventing them from moving during transit and test. Standoffs at each test site are machined to meet the depth of the package. They apply no pressure against the DUT and act as a hard stop when pogo pins apply contact force. Small holes at each test site allow for access to the top of the DUT during the test or for forced air temperature testing.
Cartridge Carrier Design Features:
Drilled for very fine pitch devices >= 0.3mm
Universal drilled arrays justify A1 to the top left corner
Number of test sites per cartridge based on DUT size and pin count
Consistent alignment features for use with different socket designs
Low-magnetic permeability materials available for lid/cartridge/hardware
ESD sensitive materials available for lid/cartridge/hardware
Provides airflow across the devices at each site
Provides fine ball alignment across individual sites
Can be drilled for arrays larger than the device size and made universal
Single and multi-site cartridge sockets align a cartridge carrier to exposed pogo pins and provide electrical contact to one or more test sites simultaneously. They are mounted to the PCB with 4 screws and can be customized in a variety of ways to meet your PCB layout and test requirements. Pogo pins provide the contact force against the DUT required for the test. Very fine pitch, low force, low-magnetic permeability pogo pins, and materials are available for sensitive DUT’s.
Single Site Clamshell Cartridge Sockets
Single Site Socket Design Features
Single-site universal array test sockets accept cartridges with various array sizes of the same pitch
Precise alignment of each test site to pin array
Test socket adds no pressure to the DUT except what is applied by the pin force
Designed for fine pitch and low pin count devices
These small footprint clamshell test sockets provide electrical contact to any single DUT loaded in a cartridge carrier. Alignment posts positioned close to the pogo pins match alignment holes corresponding to the test site on the cartridge carrier for fine vertical alignment. Single site sockets are useful for quickly retesting a suspect device that may have erroneously failed during a multi-site test.
Universal arrays justify A1 to the top left corner
Multi-Site universal array pogo pin block accepts cartridges with various array sizes of the same pitch
Cartridge allows for airflow across devices at each site
Cartridge provides ball alignment across individual sites
With a footprint that nearly matches the cartridge carrier itself, these clamshell test sockets provide electrical contact to two or more DUTs loaded in a cartridge carrier. Keyed alignment posts positioned at the long edges of the socket align the cartridge to the arrays of pogo pins and assist in vertical loading. Multi-site clamshell sockets can save valuable time in high-volume testing.
Unlike the clamshell cartridge sockets, these low-profile test sockets share a footprint with the cartridge carriers and occupy less space immediately around the test sites. cartridge carriers are mounted directly to the socket with 4 screws. With no clamshell lid to obstruct the cartridge lid, the surface of the DUT sits much closer to the surface of the assembly. Protective covers prevent debris from collecting on pogo pins when not in use with a cartridge carrier.
Custom devices require custom solutions. We apply best practice design principals in mechanical engineering and PCB layout, recognizing that a custom device under test requires an equally custom test interface solution.
We work directly with your team every step of the way, from prototype through production, to ensure your test solution meets or exceeds expectations. Reduce your overall cost of test with design options that are useful across multiple test applications.
Robson Technologies, Inc. interconnects, fixtures and systems are carefully designed, manufactured, inspected, and individually tested prior to shipment. In the unlikely case you find a defect in materials or workmanship, we will promptly repair or replace the component.
Do you need help finding a test solution? Get in touch with an RTI Engineer!