CARTRIDGE CARRIER TEST SOCKETS

Our cartridge carrier test sockets are for small and fragile wafer-level devices that are prone to handling issues between test platforms.

CARTRIDGE CARRIER SOCKET DESIGN

Cartridge carriers are a two-piece design that consists of a drilled multi-site tray and a retaining lid. Each cartridge is loaded once with multiple DUTs and used with corresponding test sockets through every stage of the product’s test lifecycle.

Cartridge Carrier Test Sockets Designed to Your Needs

Reduce your cost-of-test and device handling errors by testing small or fragile devices in a cartridge carrier socket. This unique cartridge-based design is ideal for WLCSP, bare die, MEMs devices, and packaged ICs. The cartridge carrier primarily protects small packages and devices during testing and transfers between test platforms.

Cartridge carriers are a two-piece design that aligns the DUTs in place when mounted to a test socket by screws or a clamshell lid. The cartridge can be used with single-site and multi-site sockets for various test platforms and applications.

We are not limited in designing test solutions for custom devices. Please contact us to discuss your project or start your design.

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Cartridge Carrier Features:

  • Universal arrays justify A1 to top left corner
  • Overall dimensions do not change for a range of sockets
  • Same mounting and keep-outs used across all sockets
  • Provides air flow across the devices at each site
  • Provides ball alignment across individual sites
  • Precise alignment for single-site ATE socket for real-time point testing of individual sites

Multi-Site Socket Design Features:

  • Universal arrays justify A1 to top left corner
  • Multi-Site universal array pogo pin block accepts cartridges with various array sizes of the same pitch
  • Cartridge allows for air flow across devices at each site
  • Cartridge provides ball alignment across individual sites

Single-Site Socket Design Features:

  • Single-site universal array test sockets accept cartridges with various array sizes of the same pitch
  • Precise alignment of each test site to pin array
  • Test socket adds no pressure to the DUT except what is applied by the pin force
  • Designed for fine pitch and low pin count devices

Cartridge Carrier Features:

  • Universal arrays justify A1 to top left corner
  • Overall dimensions do not change for a range of sockets
  • Same mounting and keep-outs used across all sockets
  • Provides air flow across the devices at each site
  • Provides ball alignment across individual sites
  • Precise alignment for single-site ATE socket for real-time point testing of individual sites

Multi-Site Socket Design Features:

  • Universal arrays justify A1 to top left corner
  • Multi-Site universal array pogo pin block accepts cartridges with various array sizes of the same pitch
  • Cartridge allows for air flow across devices at each site
  • Cartridge provides ball alignment across individual sites

Single-Site Socket Design Features:

  • Single-site universal array test sockets accept cartridges with various array sizes of the same pitch
  • Precise alignment of each test site to pin array
  • Test socket adds no pressure to the DUT except what is applied by the pin force
  • Designed for fine pitch and low pin count devices

Design & Concept Gallery

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MORE SOCKET SOLUTIONS

Bare Die & IC Test Sockets

For BGA, QFN, WLCSP, PGA, QFP, TSSOP and other packaged device types.  Compatible with a variety of RTI’s socket lids based on your test application.

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PCB Module Test Sockets

For small PCB sub-assemblies and multi-chip modules. Providing precise DUT alignment with relief cutouts for SMT components and more.

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Cartridge Carriers & Test Sockets

For small and fragile wafer-level devices that are prone to handling issues between test platforms.  Multi-site and single-site test socket configurations.

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Universal Array Test Sockets

For groups of BGA devices that share a common pitch but different physical dimensions. A device specific alignment plate justifies A1 to upper left corner.

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Customization Options

Test sockets can be modified in a variety of ways to accommodate unconventional devices. Discover what design options are available to meet your specific test requirements.

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Socket Lids

Lids provide compression force between the DUT and electrical contact.  Each lid style includes design features important to your test application.

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QUALITY GUARANTEE

Robson Technologies, Inc. interconnects, fixtures and systems are carefully designed, manufactured, inspected, and individually tested prior to shipment. In the unlikely case you find a defect in materials or workmanship, we will promptly repair or replace the component.

CONTACT US

Do you need help finding a test solution? Get in touch with an RTI Engineer!

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OFFICE LINE

1.408.779.8008

OFFICE HOURS

8:00am – 5:00pm PST

OFFICE LINE

OFFICE HOURS

8:00am – 5:00pm PST