CARTRIDGE CARRIER TEST SOCKETS
Our cartridge carrier test sockets are for small and fragile wafer-level devices that are prone to handling issues between test platforms.
CARTRIDGE CARRIER SOCKET DESIGN
Cartridge carriers are a two-piece design that consists of a drilled multi-site tray and a retaining lid. Each cartridge is loaded once with multiple DUTs and used with corresponding test sockets through every stage of the product’s test lifecycle.
Multi-Site Sockets
Our cartridge carriers are designed for a range of test processes and are ideal for bare die, MEMs devices and small IC packages. The multi-site design protects multiple small packages and devices during transfer between test platforms.
Single-Site Sockets
Perform functional testing of individual devices with single-site sockets and cartridge carriers. Two dowel pins in the socket base precisely align the device-loaded cartridge to the pogo pins for a rapid step-repeat test process of each test site.
Cartridge Carrier Test Sockets Designed to Your Needs
Reduce your cost-of-test and device handling errors by testing small or fragile devices in a cartridge carrier socket. This unique cartridge-based design is ideal for WLCSP, bare die, MEMs devices, and packaged ICs. The cartridge carrier primarily protects small packages and devices during testing and transfers between test platforms.
Cartridge carriers are a two-piece design that aligns the DUTs in place when mounted to a test socket by screws or a clamshell lid. The cartridge can be used with single-site and multi-site sockets for various test platforms and applications.
We are not limited in designing test solutions for custom devices. Please contact us to discuss your project or start your design.
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Cartridge Carrier Features:
- Universal arrays justify A1 to top left corner
- Overall dimensions do not change for a range of sockets
- Same mounting and keep-outs used across all sockets
- Provides air flow across the devices at each site
- Provides ball alignment across individual sites
- Precise alignment for single-site ATE socket for real-time point testing of individual sites
Multi-Site Socket Design Features:
- Universal arrays justify A1 to top left corner
- Multi-Site universal array pogo pin block accepts cartridges with various array sizes of the same pitch
- Cartridge allows for air flow across devices at each site
- Cartridge provides ball alignment across individual sites
Single-Site Socket Design Features:
- Single-site universal array test sockets accept cartridges with various array sizes of the same pitch
- Precise alignment of each test site to pin array
- Test socket adds no pressure to the DUT except what is applied by the pin force
- Designed for fine pitch and low pin count devices
Cartridge Carrier Features:
- Universal arrays justify A1 to top left corner
- Overall dimensions do not change for a range of sockets
- Same mounting and keep-outs used across all sockets
- Provides air flow across the devices at each site
- Provides ball alignment across individual sites
- Precise alignment for single-site ATE socket for real-time point testing of individual sites
Multi-Site Socket Design Features:
- Universal arrays justify A1 to top left corner
- Multi-Site universal array pogo pin block accepts cartridges with various array sizes of the same pitch
- Cartridge allows for air flow across devices at each site
- Cartridge provides ball alignment across individual sites
Single-Site Socket Design Features:
- Single-site universal array test sockets accept cartridges with various array sizes of the same pitch
- Precise alignment of each test site to pin array
- Test socket adds no pressure to the DUT except what is applied by the pin force
- Designed for fine pitch and low pin count devices
Design & Concept Gallery
MORE SOCKET SOLUTIONS
QUALITY GUARANTEE
Robson Technologies, Inc. interconnects, fixtures and systems are carefully designed, manufactured, inspected, and individually tested prior to shipment. In the unlikely case you find a defect in materials or workmanship, we will promptly repair or replace the component.
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Do you need help finding a test solution? Get in touch with an RTI Engineer!