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Click to EnlargeCustom Socket and MillingInstrumentation panel subassemblies
Click to EnlargeMarvin Test TS-900 PXI based semiconductor test system with RTI Spring pin receiver
Click to EnlargeKelvin Test Sockets for Two Pin Device Force and Sensing Applications
Click to EnlargeCopper Heat sink on Adjustable Clip on Lid over 20cfm
We provide our clients with independent, objective, and competitively priced solutions to match their testing needs. You will find that we are dedicated to delivering premium value to clients through superior technical expertise, advanced technology, and a deeply felt commitment to customer satisfaction. Our experience and dedication to testing hardware development help assure that our customers around the world qualify their products in an efficient manner.
Including a complete line of products and hardware integration including, but not limited to joint relationship with the PXI & PC-based instrumentation from GEOTEST Systems.
The TS-900 Semiconductor Test System, GBATS systems. A comprehensive digital test toolset for developing, debugging and importing digital test vectors; and all necessary instrument drivers which are compatible with a variety of application development environments including ATEasy, LabWindows, LabVIEW, Microsoft and Borland C/ C++, Microsoft Visual BASIC, and Borland Delphi.
Design and Test engineers, however, often have a different approach and different demands from their test bench(es). While the ability to set up an automated test routine is ideal for the production line, engineers, often times need to use test instruments to probe, fiddle and explore. And that’s just where RTI shines. Customization and Unique tooling subsets for various categories.
When an agency considers a device that is said to be “rugged” or “ruggedized,” what does that mean, exactly? Sure, it means it can take more punishment than an everyday laptop or phone, but in which ways? An object that withstands the cold might not also be good at taking impact, for example.
For our customers, agencies buying rugged devices that are usually MIL-STD rated should know what those ratings mean. Here are eight tests used to determine a computing device is rugged. And are typical of what RTI will incorporate in such application demands:
- Method 501.5 – High Temperature
- Method 502.5 – Low Temperature
- Method 506.5 – Rain
- Method 507.5 – Humidity
- Method 510.5 – Sand and Dust
- Method 512.5 – Immersion
- Method 514.6 – Vibration
- Method 516.6 – Shock