Join RTI November 14 – 15 in Phoenix, Arizona for ISFTA 2023! ISTFA showcases the latest technologies developed for failure analysis techniques and methods that detect defects in microelectronics and semiconductor technology.

RTI has been attending and exhibiting at ISTFA for many years, showcasing our curve trace system and software bundles. Our complete test systems are constantly being updated with new software features to keep pace with your failure analysis needs.

You’re Invited to Attend!

RTI is providing free expo-only passes for ISTFA 2023. Please register through this link and use promo code EXH40445 at checkout to receive your complimentary pass! If you have trouble registering, please contact us here. Come visit our booth #606 and experience RTI’s curve tracers!

Come visit our booth #606 and experience RTI’s curve tracers!

Curve Trace Hardware and Software Demos

RTI will be exhibiting a complete MultiTrace system with live previews of our new software suite: DataTrace Pro. DataTrace Pro automates and streamlines the process of curve tracing for high-pin count devices. It simplifies the process for test engineers to collect and analyze data from IV curve traces and write reports.

We plan to bring additional fixture solutions and our newly engineered design of flat top socket convertibles (FTSC). FTSC was developed for use in multiple test applications from inspection and failure analysis to engineering hand tests. This new design allows 100% full and unobstructed access to the surface of the DUT. It is an ideal solution for failure analysis and reliability engineers.

Schedule a DataTrace Pro Demo Onsite at ISTFA 2023!

Fill out the form below to schedule a demo onsite at ISTFA. Demos will be performed at our booth during exhibit hours only.

Exhibit hours are:

  • Tuesday, November 14: 9:30 a.m. – 6:00 p.m
  • Wednesday, November 15: 9:00 a.m. – 4:00 p.m

    Are you a current MultiTrace user?*

    Do you use a manual curve trace setup?*

    Send me curve trace literature*

    *Required Fields.