Lids provide the compression force required to make electrical contact between the DUT and electrical contact set (I.e. Pogo pins, Elastomer, etc.) Our test socket lids are tailored to your device and test applications with adjustable z-axis pressure plates, very low-profiles, open-tops, dual– latches for quick swap or integrated clamshell designs. Our socket lids are dynamic, and one of our test sockets can accept multiple lid designs. Simply change the lid style and watch as your socket changes from a failure analysis socket to a low-volume engineering or production test socket.