Ensure precise and reliable connections for semiconductor testing with advanced designs that offer durability and exceptional performance.

Engineered for reliability, these test sockets ensure optimal performance under extreme conditions, significantly reducing failure rates and enhancing device longevity.

Cost-effective, efficient testing for mid-to-high pin count IC packages, ensuring precision and versatility across various device types. Pitch range: 0.3mm to 1.27+mm.

Ideal for Flex, Rigid-Flex, PCB sub-assemblies, and multi-chip modules, with intelligent design ensuring compatibility, performance, and device access.

Reduce device handling errors by testing batches of devices using a cartridge carrier that travels with the DUTs between tests. Ideal for tiny WLCSPs and MEMs.

Flexible, convertible design for easy alignment and unrestricted access, ideal for detailed inspections and in-depth failure analysis.

Enhance your test socket with a versatile lid, compatible with various configurations and adaptable across multiple test applications.

Push the limits with custom test sockets, designed from the ground up to achieve what off-the-shelf sockets can’t.